5/23/2012 7:37 AM


 Search Edgeworth
 Glossary
ACRONYM MEANING
AC Alternating Current
DAR Daily Activity Report
DC Direct Current
DM Debit Memo
DOS Drop-off Supplier
DR Delivery Receipt
DTA Direct to Account
ESR Equipment Service Report
LOA Local Order Acceptance
MTBF Mean Time Between Failure
MTBA Mean Time Before Assist
OW Out of Warranty
PI Proforma Invoice
PM Preventive Maintenance
PO Purchase Order
POS Pick-up Supplier
PR Purchase Requisition
SE Sales Engineer
SOC Sales Order Confirmation
SP Service Personnel
SS Sales Support
UW Under Warranty

 

FRONT-OF-LINE (FOL) PROCESSES

WAFER PROBING probes are put into the wafer on the Prober machine then test is performed by the tester
BACK GRINDING the back of the wafer is grinded to a thinner thickness
DIE SAWING the wafers are mounted on the dicing tape and cut into singulated chips using precision diamond blade
2nd OPTICAL INSPECTION for chipping misalignment visual inspection using microscope
DIE BONDING the IC chip is bonded on the pad of lead frame using die bonding preform (Ag paste / solder tape or epoxy)
WIRE BONDING the electrode pads of the IC chips are bonded to inner leads of lead frame using gold wire

END-OF-LINE (EOL) PROCESSES

MOLDING the wire bonded lead frames are encapsulated to the specified package type using epoxy resin
PLATING the molded lead frames are blasted by high-pressure water, sometimes with media to clean the leads of the molded strips. Then, the molded strip are pass to electroplating machine to coat the leads with solder
MARKING the molded portion of the strip is mark by laser or by a pad-marking machine
TRIM and FORM the connections in each leads are cut simultaneously and the leads are formed
OS TESTING the devices are tested for open-short circuit of the wires
FINAL TEST the device performance is being tested in a circuit with the test pattern of the tester
TAPING PROCESS the devices are placed in a tape or in a shipping tube